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Ultrathin Non‐van der Waals Chromium Sulfide: Liquid Phase Exfoliation, Characterization, and Self‐Powered Photoelectrochemical Photodetector Application
Advanced Functional Materials ( IF 19.0 ) Pub Date : 2024-05-20 , DOI: 10.1002/adfm.202405752 Wenjie Su 1 , Artem Kuklin 2 , Linghua Jin 1 , Hans Ågren 2 , Ye Zhang 1
Advanced Functional Materials ( IF 19.0 ) Pub Date : 2024-05-20 , DOI: 10.1002/adfm.202405752 Wenjie Su 1 , Artem Kuklin 2 , Linghua Jin 1 , Hans Ågren 2 , Ye Zhang 1
Affiliation
In the search for new advanced 2D materials for technological applications and to expand the research of non‐van der Waals (non‐vdW) 2D electronic devices, this study presents a novel strategy for liquid phase exfoliation (LPE) of non‐vdW Cr2 S3 to produce Cr2 S3 nanosheets (NSs). By utilizing N ‐methyl‐2‐pyrrolidone (NMP), bulk Cr2 S3 is separated along the (001) plane, resulting in the formation of NSs with an average thickness of ≈3 nm. Various characterization techniques are applied to the Cr2 S3 material before and after LPE. Subsequently, the obtained Cr2 S3 NSs are integrated into a photoelectrochemical (PEC)‐type photodetector (PD) to evaluate the photoelectric conversion efficiency under varying conditions. The findings indicate that the developed PD exhibits a distinct self‐powered photodetection capability with a photocurrent (Pph ) of 39.5 nA cm−2 , a photoresponsivity (Rph ) of 622 nA W−1 , and a detectivity (D* ) of 0.5 × 107 Jones under 350 nm irradiation at 0 V. Moreover, the PD demonstrates rapid response time (0.06 s) and good long‐term stability (over 15 days), thus providing valuable insight for the advancement of non‐vdW Cr2 S3 ‐based optoelectronic devices.
中文翻译:
超薄非范德华硫化铬:液相剥离、表征和自供电光电化学光电探测器应用
在寻找用于技术应用的新型先进二维材料并扩大非范德华 (non-vdW) 二维电子器件的研究时,本研究提出了一种非 vdW Cr2S3 液相剥离 (LPE) 的新策略,以生产 Cr2S3 纳米片 (NSs)。通过利用 N-甲基-2-吡咯烷酮 (NMP),块状 Cr2S3 沿 (001) 平面分离,从而形成平均厚度约 3 nm 的 NS。在 LPE 之前和之后对 Cr2S3 材料应用了各种表征技术。随后,将获得的 Cr2S3 NS 集成到光电化学(PEC)型光电探测器(PD)中,以评估不同条件下的光电转换效率。研究结果表明,所开发的PD表现出独特的自供电光电探测能力,光电流(Pph)为39.5 nA cm−2,光响应度(Rph)为622 nA W−1,探测率(D*)为0.5 × 107 Jones 在 0 V 350 nm 照射下。此外,PD 表现出快速的响应时间(0.06 s)和良好的长期稳定性(超过 15 天),从而为非 vdW Cr2S3 基光电器件的发展提供了宝贵的见解。
更新日期:2024-05-20
中文翻译:
超薄非范德华硫化铬:液相剥离、表征和自供电光电化学光电探测器应用
在寻找用于技术应用的新型先进二维材料并扩大非范德华 (non-vdW) 二维电子器件的研究时,本研究提出了一种非 vdW Cr2S3 液相剥离 (LPE) 的新策略,以生产 Cr2S3 纳米片 (NSs)。通过利用 N-甲基-2-吡咯烷酮 (NMP),块状 Cr2S3 沿 (001) 平面分离,从而形成平均厚度约 3 nm 的 NS。在 LPE 之前和之后对 Cr2S3 材料应用了各种表征技术。随后,将获得的 Cr2S3 NS 集成到光电化学(PEC)型光电探测器(PD)中,以评估不同条件下的光电转换效率。研究结果表明,所开发的PD表现出独特的自供电光电探测能力,光电流(Pph)为39.5 nA cm−2,光响应度(Rph)为622 nA W−1,探测率(D*)为0.5 × 107 Jones 在 0 V 350 nm 照射下。此外,PD 表现出快速的响应时间(0.06 s)和良好的长期稳定性(超过 15 天),从而为非 vdW Cr2S3 基光电器件的发展提供了宝贵的见解。